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Ellipso Technology

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NAME MASTER DATE 19-11-19 09:31

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The 29th Workshop on Optical Technology 2019

[http://www.ellipsotech.com/bbs/board.php?bo_table=03_01&wr_id=58]

KOREA TECH SHOW_2018

[http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=57]

iMiD 2018 Korea Display Exhibition

[http://www.ellipsotech.com/bbs/board.php?bo_table=03_01&wr_id=55]

EllipsoTechnology, founded in July 2000 as an ellipsometer-based company, is producing high quality optical instruments which measure and analyze structure and optical property of thin films, as well the polarization state change of light, with ultrahigh precision. We aim to become the world-widely leading company in Ellipsometry, Reflectometry, Polarimetry with our scientific and technical excellence accumulated through more than three decades. We would like to contribute to the development and growth of your company by providing the best equipments together with customized advices related with thin films and polarization state changes of light.

1. Thin Film Measurement System (Ellipsometer)
   - Thickness, optical constant(n, k) of thin film based on polarization analysis
   - Thick and thin films (sub Å ~ 10 ㎛)
   - Single or multilayer films of dielectrics, semiconductors, metals, polymers, etc.
2. Reflectivity Measurement System (Reflectometer)
   - Hi-speed measurement of reflectivity, film thickness, n & k
   - Sub micron spot size (5, 10, 25, 50 ㎛)
   - Wide area mapping, In-line and in-situ monitoring
3. Polarization Analysis System (Polarimeter)
   - Transmission axis, absorption axis of polarizing film
   - Retardation and polarizing characteristics of optical film
   - Ultra small optical anisotropy of LCD alignment layer
   - Distribution of liquid crystal and order parameter
   - Birefringence of transparent substrate