Journal > Announcements

Korean Journal of Optics and Photonics_2019 Vol.30, Issue 4 

Birefringence Analysis of a Uniaxially Anisotropic Substrate Based on the Trajectory of the Transmission Ellipsometric Pseudoconstant in Polar Coordinates 

(유사 투과타원상수의 극좌표상 자취에 기반한 단축 이방성 기층의 복굴절 해석) 

[ http://kjop.org/articles/article/ea9Q/]

 

Korean Journal of Optics and Photonics_2017 Vol.28, Issue 1 Preview Page 

Universality of the Quasi­linear Relation Between the Order Parameter and the Normalized Birefringence of Aligned Uniaxially Anisotropic Molecules 

(정렬된 단축이방성 분자들의 질서변수와 상대 복굴절간 준선형 관계식의 보편성)

[ http://kjop.org/articles/article/7agJ/]

Korean Journal of Optics and Photonics_2016 Vol.27, Issue 6 

The Explicitly Quasi­linear Relation Between the Order Parameter and Normalized Birefringence of Aligned Uniaxially Anisotropic Molecules Determined Using a Numerical Method

(수치해석적인 방법으로 규명한 정렬된 단축이방성 분자들의 질서변수와 상대 복굴절의 준선형 관계식)

[ http://kjop.org/articles/article/NrV4/]

Korean Journal of Optics and Photonics_2015 Vol.26, Issue 5 

Ellipsometric Expressions for a Sample Coated with Uniaxially Anisotropic Layers 

(단축 이방성 박막들이 코팅된 시료의 타원식)

[ http://kjop.org/articles/article/noLr/]

Korean Journal of Optics and Photonics_2015 Vol.26, Issue 4 

Precise Measurement of the Ultrasmall Optical Anisotropy of Rubbed Polyimide Using an Improved Reflection Ellipsometer

(반사형 타원계를 이용한 러빙된 Polyimide 배향막의 초미세 광학 이방성 정밀 측정)

[ http://kjop.org/articles/article/ynrY/]

Korean Journal of Optics and Photonics_2015 Vol.26, Issue 2 

Ellipsometric Expressions for Two Uniaxially Anisotropic Layers Coated on a Multilayered Substrate 

(두개의 단축이방성 박막이 있는 다층박막 시료의 타원식)

[ http://kjop.org/articles/article/1m2V/]

Korean Journal of Optics and Photonics_2014 Vol.25, Issue 3

Tunable Quarter-wave Plate Consisting of Two Phase Retarders and the Design of a Circular Polarizer 

(두 개의 위상지연판이 중첩된 가변 4분파장 위상지연자 및 원편광자의 설계)

[ http://kjop.org/articles/article/daKk/]

Korean Journal of Optics and Photonics_2013 Vol.24, Issue 2

Precise Measurement of Ultra Small Retardation of Rubbed Polyimide Alignment Layer Using an Improved Transmission Ellipsometer

(개선된 투과형 타원계를 사용한 러빙된 Polyimide 배향막의 초미세 위상지연 정밀 측정)

[ http://kjop.org/articles/article/EN5V/]

Korean Journal of Optics and Photonics_2012 Vol.23, Issue 6

Study on Polarization Characteristics of Optical Device and Improvement of Measurement Precision of Normal Incidence Ellipsometer for Measuring Optical Anisotropy of Micro Spot 

(미소면적 광학이방성 정밀 측정을 위한 수직반사형 타원계의 광소자 편광특성 및 측정정밀도 향상 연구)

[http://kjop.org/articles/article/7a94/]

Korean Journal of Optics and Photonics_2011 Vol.22, Issue 4

Analysis of the Spectro-ellipsometric Data with Backside Reflection from Semi-transparent Substrate by Using a Rotating Polarizer Ellipsometer

(반투명 기층에 의한 후면반사를 고려한 회전검광자 방식의 타원측정 및 분석)

[ http://kjop.org/articles/article/WZB5/]